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StyleX: A Trainable Metric for X-ray Style Distances

StyleX: A Trainable Metric for X-ray Style Distances

Dominik Eckert
Christopher Syben
Christian Hümmer
L. Ritschl
Steffen Kappler
Sebastian Stober
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Papers citing "StyleX: A Trainable Metric for X-ray Style Distances"

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Title
An Interpretable X-ray Style Transfer via Trainable Local Laplacian Filter
An Interpretable X-ray Style Transfer via Trainable Local Laplacian Filter
Dominik Eckert
L. Ritschl
Christopher Syben
Christian Hümmer
Julia Wicklein
M. Beister
Steffen Kappler
Sebastian Stober
MedIm
36
0
0
11 Nov 2024