StyleX: A Trainable Metric for X-ray Style Distances

23 May 2024

Christian Hümmer

Papers citing "StyleX: A Trainable Metric for X-ray Style Distances"

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Title
An Interpretable X-ray Style Transfer via Trainable Local Laplacian Filter Dominik Eckert L. Ritschl Christopher Syben Christian Hümmer Julia Wicklein M. Beister Steffen Kappler Sebastian Stober MedIm 34 0 0 11 Nov 2024