SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering

19 February 2023

Papers citing "SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering"

3 / 3 papers shown

Title
Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes Bappaditya Dey Matthias Monden Victor Blanco Sandip Halder S. de Gendt 36 0 0 06 Sep 2024
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization Enrique Dehaerne Bappaditya Dey Sandip Halder S. de Gendt 30 1 0 18 Nov 2023
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation V. D. Ridder Bappaditya Dey S. Halder B. Waeyenberge DiffM 26 7 0 17 Jul 2023