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Deep Learning based Defect classification and detection in SEM images: A
  Mask R-CNN approach

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach

3 November 2022
Bappaditya Dey
Enrique Dehaerne
Kasem Khalil
S. Halder
Philippe Leray
Magdy A. Bayoumi
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Papers citing "Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach"

1 / 1 papers shown
Title
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and
  Segmentation as Rendering
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
MinJin Hwang
Bappaditya Dey
Enrique Dehaerne
S. Halder
Young-han Shin
ISeg
3DPC
19
10
0
19 Feb 2023
1