Papers
Communities
Events
Blog
Pricing
Search
Open menu
Home
Papers
2211.02185
Cited By
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach
3 November 2022
Bappaditya Dey
Enrique Dehaerne
Kasem Khalil
S. Halder
Philippe Leray
Magdy A. Bayoumi
Re-assign community
ArXiv
PDF
HTML
Papers citing
"Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach"
1 / 1 papers shown
Title
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
MinJin Hwang
Bappaditya Dey
Enrique Dehaerne
S. Halder
Young-han Shin
ISeg
3DPC
19
10
0
19 Feb 2023
1