Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning

7 October 2022

Papers citing "Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning"

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Title
Universal Deoxidation of Semiconductor Substrates Assisted by Machine-Learning and Real-Time-Feedback-Control Chaorong Shen Wenkang Zhan Jian Tang Zhaofeng Wu Bop Xu Chao Zhao Zhanguo Wang 37 0 0 04 Dec 2023