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Monitoring MBE substrate deoxidation via RHEED image-sequence analysis
  by deep learning

Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning

7 October 2022
Abdourahman Khaireh-Walieh
A. Arnoult
S. Plissard
Peter R. Wiecha
ArXivPDFHTML

Papers citing "Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning"

1 / 1 papers shown
Title
Universal Deoxidation of Semiconductor Substrates Assisted by
  Machine-Learning and Real-Time-Feedback-Control
Universal Deoxidation of Semiconductor Substrates Assisted by Machine-Learning and Real-Time-Feedback-Control
Chaorong Shen
Wenkang Zhan
Jian Tang
Zhaofeng Wu
Bop Xu
Chao Zhao
Zhanguo Wang
34
0
0
04 Dec 2023
1