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Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction

Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction

8 May 2025
Navya Sonal Agarwal
Jan Philipp Schneider
Kanchana Vaishnavi Gandikota
Syed Muhammad Kazim
John Meshreki
Ivo Ihrke
Michael Moeller
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Papers citing "Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction"

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