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DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing

DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing

Lo Pang-Yun Ting
Yu-Hao Chiang
Yi-Tung Tsai
Hsu-Chao Lai
Kun-Ta Chuang
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Papers citing "DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing"

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