Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network

17 November 2024

Papers citing "Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network"

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Title
Advanced Clustering Framework for Semiconductor Image Analytics Integrating Deep TDA with Self-Supervised and Transfer Learning Techniques Janhavi Giri Attila Lengyel Don Kent Edward Kibardin 27 0 0 05 May 2025