Iterative Cluster Harvesting for Wafer Map Defect Patterns

23 April 2024

Hendrik P. A. Lensch

Papers citing "Iterative Cluster Harvesting for Wafer Map Defect Patterns"

3 / 3 papers shown

Title
Advanced Clustering Framework for Semiconductor Image Analytics Integrating Deep TDA with Self-Supervised and Transfer Learning Techniques Janhavi Giri Attila Lengyel Don Kent Edward Kibardin 22 0 0 05 May 2025
Combining pretrained CNN feature extractors to enhance clustering of complex natural images Joris Guérin Stéphane Thiery E. Nyiri O. Gibaru Byron Boots 47 43 0 07 Jan 2021
Xception: Deep Learning with Depthwise Separable Convolutions François Chollet MDE BDL PINN 248 14,387 0 07 Oct 2016