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HardTaint: Production-Run Dynamic Taint Analysis via Selective Hardware Tracing
27 February 2024
Yiyu Zhang
Tianyi Liu
Yueyang Wang
Yun Qi
Kai Ji
Jian Tang
Xiaoliang Wang
Xuandong Li
Zhiqiang Zuo
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Papers citing
"HardTaint: Production-Run Dynamic Taint Analysis via Selective Hardware Tracing"
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μ
μ
μ
AFL: Non-intrusive Feedback-driven Fuzzing for Microcontroller Firmware
Wenqiang Li
Jiameng Shi
Fengjun Li
Jingqiang Lin
Wei Wang
Le Guan
40
43
0
07 Feb 2022
1
