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2305.12822
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Quantifying the effect of X-ray scattering for data generation in real-time defect detection
22 May 2023
Vladyslav Andriiashen
R. V. Liere
Tristan van Leeuwen
K. Batenburg
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"Quantifying the effect of X-ray scattering for data generation in real-time defect detection"
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