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Defect Detection Approaches Based on Simulated Reference Image

Defect Detection Approaches Based on Simulated Reference Image

Nati Ofir
Y. Ben-Shoshan
Ran Badanes
Boris Sherman
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Papers citing "Defect Detection Approaches Based on Simulated Reference Image"

4 / 4 papers shown
Title
Towards Total Recall in Industrial Anomaly Detection
Towards Total Recall in Industrial Anomaly Detection
Karsten Roth
Latha Pemula
J. Zepeda
Bernhard Schölkopf
Thomas Brox
Peter V. Gehler
UQCV
80
907
0
15 Jun 2021
Very Deep VAEs Generalize Autoregressive Models and Can Outperform Them on Images
Very Deep VAEs Generalize Autoregressive Models and Can Outperform Them on Images
R. Child
BDL
VLM
177
350
0
20 Nov 2020
PaDiM: a Patch Distribution Modeling Framework for Anomaly Detection and Localization
PaDiM: a Patch Distribution Modeling Framework for Anomaly Detection and Localization
Thomas Defard
Aleksandr Setkov
Angélique Loesch
Romaric Audigier
UQCV
75
837
0
17 Nov 2020
Wider or Deeper: Revisiting the ResNet Model for Visual Recognition
Wider or Deeper: Revisiting the ResNet Model for Visual Recognition
Zifeng Wu
Chunhua Shen
Anton Van Den Hengel
SSeg
597
1,511
0
30 Nov 2016