Optimizing YOLOv7 for Semiconductor Defect Detection

19 February 2023

Papers citing "Optimizing YOLOv7 for Semiconductor Defect Detection"

7 / 7 papers shown

Title
Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes Bappaditya Dey Matthias Monden Victor Blanco Sandip Halder S. de Gendt 36 0 0 06 Sep 2024
Consensus Focus for Object Detection and minority classes Erik Isai Valle Salgado Chen Li Yaqi Han Linchao Shi Xinghui Li 10 0 0 10 Jan 2024
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy V. D. Ridder Bappaditya Dey Victor Blanco Sandip Halder B. Waeyenberge 11 3 0 19 Nov 2023
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization Enrique Dehaerne Bappaditya Dey Sandip Halder S. de Gendt 25 1 0 18 Nov 2023
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review Thibault Lechien Enrique Dehaerne Bappaditya Dey Victor Blanco Sandip Halder S. de Gendt Wannes Meert 19 8 0 16 Aug 2023
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection V. D. Ridder Bappaditya Dey Enrique Dehaerne S. Halder S. de Gendt B. Waeyenberge 19 5 0 14 Aug 2023
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach Enrique Dehaerne Bappaditya Dey Hossein Esfandiar L. Verstraete H. Suh S. Halder S. de Gendt 24 13 0 28 Jul 2023