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Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network

Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network

Yuanfu Yang
Min Sun
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Papers citing "Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network"

2 / 2 papers shown
Title
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers
Faisal Mohammad
Duksan Ryu
38
0
0
03 Apr 2025
MobileNets: Efficient Convolutional Neural Networks for Mobile Vision Applications
MobileNets: Efficient Convolutional Neural Networks for Mobile Vision Applications
Andrew G. Howard
Menglong Zhu
Bo Chen
Dmitry Kalenichenko
Weijun Wang
Tobias Weyand
M. Andreetto
Hartwig Adam
3DH
950
20,613
0
17 Apr 2017