WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects

3 July 2022

Papers citing "WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects"

5 / 5 papers shown

Title
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers Faisal Mohammad Duksan Ryu 33 0 0 03 Apr 2025
SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image Qian Jin Yuqi Jiang Xudong Lu Yumeng Liu Yining Chen Dawei Gao Qi Sun Cheng Zhuo 75 0 0 24 Feb 2025
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection V. D. Ridder Bappaditya Dey Enrique Dehaerne S. Halder S. de Gendt B. Waeyenberge 24 5 0 14 Aug 2023
Industrial Anomaly Detection with Domain Shift: A Real-world Dataset and Masked Multi-scale Reconstruction Zilong Zhang Zhibin Zhao Xingwu Zhang Chuang Sun Xuefeng Chen 27 50 0 05 Apr 2023
SegNet: A Deep Convolutional Encoder-Decoder Architecture for Image Segmentation Vijay Badrinarayanan Alex Kendall R. Cipolla SSeg 446 15,645 0 02 Nov 2015