A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations

19 August 2021

Papers citing "A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations"

6 / 6 papers shown

Title
Linking the Dynamic PicoProbe Analytical Electron-Optical Beam Line / Microscope to Supercomputers Alexander Brace Rafael Vescovi Ryan Chard Nickolaus Saint Arvind Ramanathan N. Zaluzec Ian T. Foster 10 2 0 25 Aug 2023
Machine learning for classifying and interpreting coherent X-ray speckle patterns Mingren Shen D. Sheyfer T. Loeffler S. Sankaranarayanan G. Stephenson Maria K. Y. Chan D. Morgan 11 0 0 15 Nov 2022
Performance, Successes and Limitations of Deep Learning Semantic Segmentation of Multiple Defects in Transmission Electron Micrographs Ryan Jacobs Mingren Shen Yuhan Liu Wei Hao Xiaoshan Li ... Zeming Xie Zitong Huang Chao Wang Kevin G. Field D. Morgan 17 2 0 15 Oct 2021
Exploring Generative Adversarial Networks for Image-to-Image Translation in STEM Simulation N. Lawrence Mingren Shen Ruiqing Yin Cloris Feng D. Morgan GAN 19 2 0 29 Oct 2020
Microscope 2.0: An Augmented Reality Microscope with Real-time Artificial Intelligence Integration Pojui Chen Krishna Gadepalli Robert MacDonald Yun-hui Liu K. Nagpal Timo Kohlberger Jeffrey Dean G. Corrado J. Hipp Martin C. Stumpe 19 41 0 21 Nov 2018
SegNet: A Deep Convolutional Encoder-Decoder Architecture for Image Segmentation Vijay Badrinarayanan Alex Kendall R. Cipolla SSeg 446 15,637 0 02 Nov 2015