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Fault Diagnosis in Microelectronics Attachment via Deep Learning
  Analysis of 3D Laser Scans

Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans

25 February 2020
N. Dimitriou
Lampros Leontaris
T. Vafeiadis
D. Ioannidis
T. Wotherspoon
Gregory Tinker
Dimitrios Tzovaras
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Papers citing "Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans"

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