Weakly Supervised Contrastive Learning for Histopathology Patch Embeddings

Digital histopathology whole slide images (WSIs) provide gigapixel-scale high-resolution images that are highly useful for disease diagnosis. However, digital histopathology image analysis faces significant challenges due to the limited training labels, since manually annotating specific regions or small patches cropped from large WSIs requires substantial time and effort. Weakly supervised multiple instance learning (MIL) offers a practical and efficient solution by requiring only bag-level (slide-level) labels, while each bag typically contains multiple instances (patches). Most MIL methods directly use frozen image patch features generated by various image encoders as inputs and primarily focus on feature aggregation. However, feature representation learning for encoder pretraining in MIL settings has largely been neglected.