Anomaly detection has gained considerable attention due to its broad range of applications, particularly in industrial defect detection. To address the challenges of data collection, researchers have introduced zero-/few-shot anomaly detection techniques that require minimal normal images for each category. However, complex industrial scenarios often involve multiple objects, presenting a significant challenge. In light of this, we propose a straightforward yet powerful multi-scale memory comparison framework for zero-/few-shot anomaly detection. Our approach employs a global memory bank to capture features across the entire image, while an individual memory bank focuses on simplified scenes containing a single object. The efficacy of our method is validated by its remarkable achievement of 4th place in the zero-shot track and 2nd place in the few-shot track of the Visual Anomaly and Novelty Detection (VAND) competition.
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