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Optimal Learning via the Fourier Transform for Sums of Independent Integer Random Variables

4 May 2015
Ilias Diakonikolas
D. Kane
Alistair Stewart
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Abstract

We study the structure and learnability of sums of independent integer random variables (SIIRVs). For k∈Z+k \in \mathbb{Z}_{+}k∈Z+​, a kkk-SIIRV of order n∈Z+n \in \mathbb{Z}_{+}n∈Z+​ is the probability distribution of the sum of nnn independent random variables each supported on {0,1,…,k−1}\{0, 1, \dots, k-1\}{0,1,…,k−1}. We denote by Sn,k{\cal S}_{n,k}Sn,k​ the set of all kkk-SIIRVs of order nnn. In this paper, we tightly characterize the sample and computational complexity of learning kkk-SIIRVs. More precisely, we design a computationally efficient algorithm that uses O~(k/ϵ2)\widetilde{O}(k/\epsilon^2)O(k/ϵ2) samples, and learns an arbitrary kkk-SIIRV within error ϵ,\epsilon,ϵ, in total variation distance. Moreover, we show that the {\em optimal} sample complexity of this learning problem is Θ((k/ϵ2)log⁡(1/ϵ)).\Theta((k/\epsilon^2)\sqrt{\log(1/\epsilon)}).Θ((k/ϵ2)log(1/ϵ)​). Our algorithm proceeds by learning the Fourier transform of the target kkk-SIIRV in its effective support. Its correctness relies on the {\em approximate sparsity} of the Fourier transform of kkk-SIIRVs -- a structural property that we establish, roughly stating that the Fourier transform of kkk-SIIRVs has small magnitude outside a small set. Along the way we prove several new structural results about kkk-SIIRVs. As one of our main structural contributions, we give an efficient algorithm to construct a sparse {\em proper} ϵ\epsilonϵ-cover for Sn,k,{\cal S}_{n,k},Sn,k​, in total variation distance. We also obtain a novel geometric characterization of the space of kkk-SIIRVs. Our characterization allows us to prove a tight lower bound on the size of ϵ\epsilonϵ-covers for Sn,k{\cal S}_{n,k}Sn,k​, and is the key ingredient in our tight sample complexity lower bound. Our approach of exploiting the sparsity of the Fourier transform in distribution learning is general, and has recently found additional applications.

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